A wafer VPD methodology provider you can trust

 

Accumulating years of experience, VISL is  a world leading company who develops reliable equipment using VPD methodology for wafer surface heavy metal contamination analysis.

Contineuos research and development in such field is extending VISL to future analysis needs.  

Awarded with patent-pending methodology, VISL offers analysis applications include wafer surface, wafer bulk, and wafer bevel. 

Visit

 

8233 SW Cirrus Drive, 16-J, Beaverton OR 97008

 

Call

 

 

Mobile: +1-503-583-3090
 

Contact

 

yenchoo@[removed]vpdintegrationservice.com

vislyenchoo@gmail.com

© 2013 by VPD Integration Service LLC.