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VPD Integration Service LLC​​
Wafer Surface Heavy Metal Contamination Analysis
A wafer VPD methodology provider you can trust
Accumulating years of experience, VISL is a world leading company who develops reliable equipment using VPD methodology for wafer surface heavy metal contamination analysis.
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Contineuos research and development in such field is extending VISL to future analysis needs.
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Awarded with patent-pending methodology, VISL offers analysis applications include wafer surface, wafer bulk, and wafer bevel.
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