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VPD Integration Service LLC
Wafer Surface Heavy Metal Contamination Analysis
A wafer VPD methodology provider you can trust
Accumulating years of experience, VISL is a world leading company who develops reliable equipment using VPD methodology for wafer surface heavy metal contamination analysis.
Contineuos research and development in such field is extending VISL to future analysis needs.
Awarded with patent-pending methodology, VISL offers analysis applications include wafer surface, wafer bulk, and wafer bevel.
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