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A wafer VPD methodology provider you can trust

 

Wafer VPD Analysis

Accumulating years of experience, VISL is  a world leading company who develops reliable equipment using VPD methodology for wafer surface heavy metal contamination analysis.

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Contineuos research and development in such field is extending VISL to future analysis needs.  

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Awarded with patent-pending methodology, VISL offers analysis applications include wafer surface, wafer bulk, and wafer bevel. 

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